A new type of micro-X-ray diffractometer focused by polycapillary optics
Jiang Qi-Li1, Duan Ze-Ming1, Shuai Qi-Lin1, Li Rong-Wu2, Pan Qiu-Li1, Cheng Lin1
1. Key Laboratory of Beam Technology Ministry of Education, College of Nuclear Science and Technology, Beijing Normal University, Beijing 100875, China; 2. Department of Physics, Beijing Normal University, Beijing 100875, China
Abstract：Micro-X-ray diffraction (μ-XRD) plays a significant role in measuring the phase structures of small samples or micro areas of larger samples. In this article, we propose a new type of desktop micro-X-ray diffractometer named μ-Hawk focused by polycapillary optics. It consists mainly of a microfocus X-ray tube, polycapillary optics, receiving slits, a silicon drift diode (SDD) X-ray detector integrated with single/multi-channel pulse analyzer, independently rotating θ-θ goniometer, high precision XYZ sample stage, computer programs developed by LabVIEW codes, etc. The main interface of the program has micro-X-ray diffraction analysis mode and micro energy dispersive X-ray fluorescence analysis mode. In addition, the monochromatization of X-ray, the angular resolution and the accuracy of the results of μ-Hawk are discussed. In order to demonstrate the feasibility of the instrument, the phase of micro area in the middle of the first stroke on the Chinese character “Jiao” from a 5-Jiao coin (Chinese currency) is measured by the μ-Hawk, and the phase of a copper wire 140 μm in diameter is also detected by it. After that, the phase of 1.0 mm×0.6 mm area on the welding joint of the motherboard from an iPhone is two-dimensionally scanned by μ-Hawk. The θ-θ scanning is performed at each detected point inside the two-dimensional area. Four motors drive the X and Y axis of the sample stage as well as the θ1 and θ2 axis of the goniometer to accomplish the above functions. The results show that the micro energy dispersive X-ray fluorescence analysis mode of μ-Hawk can provide elementary reference information for the analysis of phase structure. Compared with conventional X-ray diffractometer, the μ-Hawk can detect the same diffraction peaks on the coin with lower background. Furthermore, the accurate diffraction peaks can be measured with a lower power and shorter time. The measured results can better reflect the true phase structure of the micro area. Six diffraction peaks and their phases can be clearly identified from the diffraction pattern of the copper wire. For the welding joint, the phase mapping of SnO2(3 1 2) is acquired through data processing. Therefore, the μ-Hawk can adapt to the micro-X-ray diffraction analysis of small samples or micro areas of samples as well as the two-dimensional scanning analysis of phase mapping. The μ-Hawk exhibits the unique advantages of accomplishing accurate micro-X-ray diffraction analysis, convenient software, low working power, time saving, and small in size. It indicates a wide application prospect in the fields of materials, geosciences and heritage protection.
Jiang Qi-Li, Duan Ze-Ming, Shuai Qi-Lin, Li Rong-Wu, Pan Qiu-Li, Cheng Lin. A new type of micro-X-ray diffractometer focused by polycapillary optics. Acta Physica Sinica, 2019, 68(24):
.
doi:10.7498/aps.68.20190497.
Dikmen G, Alver Ö, Parlak C 2018 Chem. Phys. Lett. 698 114
[2]
Thota S, Kashyap S C, Sharma S K, Reddy V R 2016 Mater. Sci. Eng. B 206 69
[3]
Zhou X, Liu D, Bu H, Deng L, Liu H, Yuan P, Du P, Song H 2018 Solid Earth 3 16
[4]
Wang W Q, Ji L, Li H X, Liu X H, Zhou H D, Chen J M 2019 Chin. Phys. B 28 036802
[5]
Biberger J, Füßer H J, Klaus M, Genzel C 2017 Wear 376– 377 1502
[6]
Dappe V, Uzu G, Schreck E, Wu L, Li X, Dumat C, Moreau M, Hanoune B, Ro C, Sobanska S 2018 Atmos. Pollut. Res. 9 697
[7]
Myoung J H, Lee D R, Sung H I, Jeong A Y, Chang Y S, Kim H J, Sun W J, Young W C, Young T H, Myung J K 2018 Eur. J. Pharm. Biopharm. 130 143
[8]
Shen Y Y, Zhang Y X, Qi T, Qiao Y, Jia Y X, Hei H J, He Z Y, Yu S W 2016 Chin. Phys. Lett. 33 088101
[9]
Hampai D, Dabagov S B, Cappuccio G 2015 Nucl. Instrum. Methods Phys. Res., Sect. B 355 264
[10]
Duan Z M, Liu J, Jiang Q L, Pan Q L, Cheng L 2019 Nucl. Instrum. Methods Phys. Res. Sect. B 442 13
[11]
Berthold C, Bjeoumikhov A, Brügemann L 2009 Part. Part. Syst. Charact. 26 107
[12]
Romano F P, Pappalardo L, Masini N, Pappalardo G, Rizzo F 2011 Microchem. J. 99 449
[13]
Nakai I, Abe Y 2012 Appl. Phys. A 106 279
[14]
Duan Z M, Liu J, Jiang Q L, Pan Q L, Li R W, Cheng L 2019 Spectroscopy and Spectral Analysis 39 303[段泽明, 刘俊, 姜其立, 潘秋丽, 李融武, 程琳 2019 光谱学与光谱分析 39 303]
[15]
Wrobel P, Czyzycki M, Furman L, Kolasinski K, Lankosz M, Mrenca A, Samek L, Wegrzynek D 2012 Talanta 93 186
[16]
Hodoroaba V D, Radtke M, Reinholz U, Riesemeier H, Vincze L, Reuter D 2011 Nucl. Instrum. Methods Phys. Res. Sect. B 269 1493
[17]
Décobert J, Guillamet R, Mocuta C, Carbone G, Guerault H 2013 J. Cryst. Growth 370 154
[18]
Jiang C H 2014 The Technique and Application of Polycrystalline X-ray Diffraction (Beijing: Chemical Industry Press) p169 (in Chinese)[江超华 2014 多晶X射线衍射技术与应用 (北京: 化学工业出版社) 第169页]
[19]
Xu X M, Miao W, Tao K 2014 Acta Phys. Sin. 63 136001[徐晓明, 苗伟, 陶琨 2014 物理学报 63 136001]
[20]
Pradell T, Molera J, Salvadó N, Labrador A 2010 Appl. Phys. A 99 407
[21]
Baated A, Hamasaki K, Kim S S, Kim K S, Suganuma K 2011 J. Electron. Mater. 40 2278
[22]
Zhou W, Mahato D N, Macdonald C A 2010 Thin Solid Films 518 5047
2019, Vol. 68 
